温 暁青

講演・口頭発表等

• Power-Aware IC Testing: Present and Future

  The 1st CCF Chip Conference 2022年7月30日
• Power-Aware Testing for Low-Power VLSI Circuits

  The 14th IEEE International Symposium on Embedded Multicore/Many-core Systems-on-Chip 2021年12月21日
• LSI Testing: A Core Technology to A Successful LSI Industry

  The IEEE International Conference on ASIC 2021年10月29日
• LSI Testing: A Core Technology to a Successful Semiconductor Industry

  The 8th IEEE & 9th International Conference on Science, Education, and Viable Engineering 2021年10月29日
• LSI Testing: A Core Technology to a Successful Semiconductor Industry

  The 2021 IEEE International Conference on Electron Devices and Applications 2021年8月15日
• Power-Aware Testing for Low-Power LSI Circuits

  The 9th IEEE International Symposium on Next-Generation Electronics 2021年7月10日
• LSI Testing: A Core Technology to a Successful Semiconductor Industry

  The 2nd IEEE International Conference on Control, Measurement and Instrumentation 2021年1月9日
• LSI Testing: A Core Technology to a Successful Semiconductor Industry

  The 8th IEEE International Symposium on Next-Generation Electronics 2019年10月9日
• LSI Test: from Research to Business

  The 18th China Fault Tolerant Computing Conference 2019年8月15日
• Power-Aware Testing of Low-Power VLSI Circuits

  The 15th IEEE International Conference on Electron Devices and Solid-State Circuits 2019年6月13日
• Power-Aware Testing for Low-Power LSI Circuits

  特別講演会 2018年12月28日
• LSI Testing: A Core Technology to a Successful Semiconductor Industry

  International Conference on Advanced Mechnical and Electronical Engineering 2018年12月27日
• All about ICs: From Technology Trends to Career Choices

  特別講演会 2018年12月26日
• Power-Aware VLSI Testing -Challenges and Strategies-

  The Workshop of Artificial Intelligence and Its Applications on Next Generation of Internet of Things 2018年8月20日
• Power-Aware Testing for Low-Power VLSI Circuits

  The 2nd International Conference on Circuits, Devices and Systems 2018年8月5日
• Power-Aware LSI Testing: Challenges and Strategies

  特別講演会 2018年3月29日
• Power-Aware Testing for Low-Power VLSI Circuits

  特別講演会 2017年12月29日
• Power-Aware Testing for Low-Power VLSI Circuits

  The 5th Int'l Symp. on Applied Engineering and Sciences 2017年11月14日
• IC: Technical Trends and Career Development

  特別講演会 2017年3月10日
• IC: Technical Trends and Career Development

  特別講演会 2017年3月8日