温 暁青

論文

• QART: A low-power quadruple-node-upset hardened latch based on asymmetric ring topology

  Huang Z., Yang S., Wu J., Wang X., Lu Y., Pan J., Cheng F., Wen X., Yan A.

  Microelectronics Journal 176 2026年10月 査読有り
• LOSTA: A low-overhead high-defect-detectability test-aware hardened latch with layout-aware short-defect modeling

  Xu H., Zhao Z., Ma R., Holst S., Wang S., Liang H., Wen X.

  Microelectronics Journal 175 2026年9月 査読有り
• A Novel Approach to Reducing Testing Costs and Minimizing Defect Escapes Using Dynamic Neighborhood Range and Shapley Values

  Ni T., Rui W., Zhuo C., Li Y., Wen X., Nie M.

  ACM Transactions on Design Automation of Electronic Systems 31(4) 2026年7月 査読有り
• LTTL: A Low-Overhead and Triple-Node-Upset-Tolerant Latch Design for Aerospace Applications

  Ma Z., Gao Z., Guo X., Liu Q., Man Y., Liang H., Wen X.

  Glsvlsi 2026 Proceedings of the Great Lakes Symposium on VLSI 2026 187-193 2026年6月22日 査読有り
• Design of Quintuple-Node-Upset Hardened Latches Based on C-Element Voting and an Analog Voter

  Huang Z., Yang S., Wu J., Wang X., Lu Y., Pan J., Cheng F., Wen X., Yan A.

  IEEE Transactions on Device and Materials Reliability 26(2) 604-615 2026年6月1日 査読有り
• High-Accuracy, Low-Utilization Multichannel 2-ps Bin Size FPGA Digital-to-Time Converter Based on Compact Multidimensional Delay Array

  Chen P., Wijaya J.A., Chen C., Wen X., Holst S.

  IEEE Transactions on Very Large Scale Integration VLSI Systems 34(6) 1930-1939 2026年6月1日 査読有り
• Hi-ILT: A hybrid End-to-End framework of lightweight hierarchical VAE and physics-Guided ILT for inverse lithography technology

  Xu H., Wang T., Zhao Z., Ma R., Wen X., Liang H.

  Optics and Lasers in Engineering 200 2026年5月 査読有り
• Functional Fault Impact Probability Prediction using Spatio-Temporal Graph Convolutional Network

  Wei S., Wang S., Kai H., Higami Y., Ma R., Ni T., Wen X., Takahashi H.

  ACM Transactions on Design Automation of Electronic Systems 31(5) 2026年4月8日 査読有り
• Nonvolatile Flip-Flop Designs with Soft Error Recovery Based on Magnetic Tunnel Junction and CMOS for Aerospace Applications

  Gao Z., Liu H., Song J., Pei Z., Jiang W., Wang Q., Wen X.

  Journal of Electronic Testing Theory and Applications JETTA 42(2) 249-257 2026年4月 査読有り
• Design and verification of a robust near-memory computing architecture for image fusion tasks

  Yan A. (Heifei University of Technology), Bao H. (Heifei University of Technology), Cui J. (Heifei University of Technology), Waris H., Li J. (Heifei University of Technology), Wen X.

  Microelectronics Journal 168 2026年2月 査読有り
• Incremental learning strategies for improved detection of unknown defects in wafer maps with limited samples

  Ni T., Jiang W., Liang H., Wen X., Nie M.

  Computers in Industry 175 2026年2月 査読有り
• A Highly Robust and Low-Cost Multiple Node Upset Resilient Fast Latch for Radiation Applications

  Bai N., Wang F., Xu Y., Wang S., Wen X.

  IEEE Transactions on Aerospace and Electronic Systems 62 4411-4421 2026年1月 査読有り
• ACDRL: Aging-Mitigated C-Elements Based Double-Node-Upset-Recoverable Latch for Long-Term Reliability Enhancement

  Dong C. (Heifei University of Technology), Yan A. (Heifei University of Technology), Guo X. (Heifei University of Technology), Pei Z. (Heifei University of Technology), Wang Q. (Heifei University of Technology), Huang Z. (Heifei University of Technology), Girard P., Wen X.

  IEEE Transactions on Aerospace and Electronic Systems 62 6645-6652 2026年1月 査読有り
• Algorithm-Aided Design and Verification for Multiple-Node-Upset-Recovery Latches

  Pei Z., Li J., Waris H., Younis M.S., Yan A., Deng J., Gui Y., Wen X.

  Proceedings IEEE International Symposium on Circuits and Systems 4063-4067 2026年1月 査読有り
• Automated Co-Optimization Framework of Feature Selection and Ensemble Learning for Wafer Yield Prediction

  Ni T., Wu H., Cheng M., Bian J., Wang S., Wen X., Nie M.

  IEEE Transactions on Automation Science and Engineering 23 11245-11257 2026年1月 査読有り
• FN2LD: FeFET-based nonvolatile and node-upset-recovery latch designs with cost optimization

  Yan A. (Heifei University of Technology), Jiang W. (Heifei University of Technology), Wang H. (Heifei University of Technology), Kang B. (Heifei University of Technology), Huang Z. (Heifei University of Technology), Ni T., Wen X., Girard P.

  Microelectronics Journal 167 2026年1月 査読有り
• Locating Hotspots based on Switching Probability Calculation and Functional Analysis with Partial Truth Table

  OGATA Yuusei, YAMASHITA Tomoya, MIYASE Kohei, LU Shyue-Kung, WEN Xiaoqing

  IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences advpub 2026年1月 査読有り
• Low-Delay, High-Robustness DNU Self-Healing Latch Based on the C-Element Feedback Loop

  Bai N., Xu P., Xu Y., Wen X.

  IEEE Transactions on Aerospace and Electronic Systems 62 5974-5985 2026年1月 査読有り
• RMC PUF: A Highly Reliable PUF Architecture Based on Recursive Markov Chain Obfuscation

  Huang Z., Yang Z., Sun X., Lu Y., Bian J., Ouyang Y., Ni T., Wen X.

  IEEE Transactions on Very Large Scale Integration VLSI Systems 34(8) 2558-2570 2026年1月 査読有り
• LOCO: A Low-Cost SNU-Self-Resilient Latch Using an Output-Split C-Element.

  Ruijun Ma, Xin Chen, Xiaoqing Wen, Hui Xu, Shengnan Ye, Chuanjian Zhang, Senling Wang

  CoRR abs/2512.19292 2025年12月