温 暁青

MISC

• Fault Detection with Optimum March Test Algorithm

  N. Zakaria, W. Hassan, I. Halin, R. Sidek, X. Wen

  Journal of Theoretical and Applied Information Technology 47(1) 18-27 2013年
• Search Space Reduction for Low-Power Test Generation

  Kohei Miyase, Matthias Sauer, Bernd Becker, Xiaoqing Wen, Seiji Kajihara

  2013 22ND ASIAN TEST SYMPOSIUM (ATS) 171-176 2013年
• On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST

  A. Tomita, X. Wen, Y. Sato, S. Kajihara, P. Girard, M. Tehranipoor, L. -T. Wang

  2013 22ND ASIAN TEST SYMPOSIUM (ATS) 19-24 2013年
• On Guaranteeing Capture Safety in At-Speed Scan Testing With Broadcast-Scan-Based Test Compression

  Kazunari Enokimoto, Xiaoqing Wen, Kohei Miyase, Jiun-Lang Huang, Seiji Kajihara, Laung-Terng Wang

  2013 26TH INTERNATIONAL CONFERENCE ON VLSI DESIGN AND 2013 12TH INTERNATIONAL CONFERENCE ON EMBEDDED SYSTEMS (VLSID) 279-284 2013年
• Fault Detection with Optimum March Test Algorithm

  N. Zakaria, W. Hassan, I. Halin, R. Sidek, X. Wen

  Journal of Theoretical and Applied Information Technology 47(1) 18-27 2013年1月1日 査読有り
• Estimation of the Amount of Don't-Care Bits in Test Vectors

  K. Miyase, S. Kajihara, X. Wen

  IEEE Workshop on RTL and High Level Testing 2012年11月22日 査読有り
• A Transition Isolation Scan Cell Design for Low Shift and Capture Power

  Y.-T. Lin, J.-L Huang, X. Wen

  IEEE Asian Test Symposium 107-112 2012年11月19日 査読有り
• A Transition Isolation Scan Cell Design for Low Shift and Capture Power

  Y.-T. Lin, J.-L Huang, X. Wen

  IEEE Asian Test Symposium 107-112 2012年11月19日 査読有り
• Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains

  Shianling Wu, Laung-Terng Wang, Xiaoqing Wen, Wen-Ben Jone, Michael S. Hsiao, Fangfang Li, James Chien-Mo Li, Jiun-Lang Huang

  ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS 17(4) 2012年10月
• A Transition Isolation Scan Cell Design for Low Shift and Capture Power

  Y.-T. Lin, J.-L. Huang, X. Wen

  VLSI Test Technology Workshop 2012年7月10日 査読有り
• Estimation of the Amount of Don't-Care Bits in Test Vectors

  K. Miyase, S. Kajihara, X. Wen

  IEEE Workshop on RTL and High Level Testing 2012年
• A Transition Isolation Scan Cell Design for Low Shift and Capture Power

  Y.-T. Lin, J.-L. Huang, X. Wen

  VLSI Test Technology Workshop 2012年
• Power-Aware Testing: The Next Stage

  Xiaoqing Wen

  2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) 2012年
• On Pinpoint Capture Power Management in At-Speed Scan Test Generation

  X. Wen, Y. Nishida, K. Miyase, S. Kajihara, P. Girard, M. Tehranipoor, L. -T. Wang

  PROCEEDINGS INTERNATIONAL TEST CONFERENCE 2012 2012年
• Power-aware testing: The next stage

  Xiaoqing Wen

  Proceedings - 2012 17th IEEE European Test Symposium, ETS 2012 2012年
• A Novel Capture-Safety Checking Method for Multi-Clock Designs and Accuracy Evaluation with Delay Capture Circuits

  Kohei Miyase, Masao Aso, Ryou Ootsuka, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Kazunari Enokimoto, Seiji Kajihara

  2012 IEEE 30TH VLSI TEST SYMPOSIUM (VTS) 197-202 2012年
• Layout-aware pattern evaluation and analysis for power-safe application of transition delay fault patterns

  Hassan Salmani, Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty, Patrick Girard, Xiaoqing Wen

  Journal of Low Power Electronics 8(2) 248-258 2012年
• Fault detection with optimum March test algorithm

  Nor Azura Zakaria, W. Z.W. Hasan, I. A. Halin, R. M. Sidek, Xiaoqing Wen

  Proceedings - 3rd International Conference on Intelligent Systems Modelling and Simulation, ISMS 2012 700-704 2012年
• Additional Path Delay Fault Detection with Adaptive Test Data

  K. Miyase, H. Tanaka, K. Enokimoto, X. Wen, S. Kajihara

  IEEE Workshop on RTL and High Level Testing 31-34 2011年11月24日 査読有り
• Towards the Next Generation of Low-Power Test Technologies

  X. Wen

  IEEE International Conference on ASIC 2011年10月27日 査読有り責任著者