2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

• • IEEE International Workshop on Memory Technology, Design, and Testing
• • IEEE Computer Society. Test Technology Technical Council
• • 清華大学 セイカ ダイガク qing hua da xue

• • IEEE International Workshop on Memory Technology, Design, and Testing
• • IEEE Computer Society. Test Technology Technical Council
• • 清華大学 セイカ ダイガク qing hua da xue

2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University

IEEE Computer Society, c2005

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• 東京科学大学 大岡山図書館

  I10625/231313094471X

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"IEEE Computer Society Order Number P2313"--T.p. verso

Includes bibliographical references and author index