Text ( visual ) : unmediated
2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan / IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University. -- Los Alamitos, Calif. : IEEE Computer Society , c2005. -- xxv, 153 p. : ill. ; 27 cm. -- "IEEE Computer Society Order Number P2313"--T.p. verso ; Includes bibliographical references and author index. -- ISBN 0769523137 ; (BA80823517) ; https://ci.nii.ac.jp/ncid/BA80823517
Author Heading(s): IEEE International Workshop on Memory Technology, Design, and Testing ; IEEE Computer Society. Test Technology Technical Council ; 清華大学. -- Classification(s): LCC : TK7895.M4 ; DC22 : 621.39/732. -- Subject Heading(s): LCSH : Semiconductor storage devices -- Testing -- Congresses ; LCSH : Random access memory -- Congresses
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