IEEE International Workshop on Memory Technology, Design, and Testing

ID:DA12300318

別名: International Workshop on Memory Technology, Design, and Testing, IEEE

Workshop on Memory Technology, Design, and Testing, IEEE International

International Workshop on Memory Technology, Design, and Testing

MTDT

関連著者名: IEEE International Workshop on Memory Testing (1993 : San Jose, Calif.)

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2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University

IEEE Computer Society c2005

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Records of the 2004 International Workshop on Memory Technology, Design and Testing : MTDT 2004 : 9-10 August, 2004, San Jose, California, USA

edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society

IEEE Computer Society c2004

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3

Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]

IEEE Computer Society c2003

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4

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society

IEEE Computer Society c2002

: bookbroker

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5

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA

editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Society

IEEE Computer Society c2001

: case

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6

Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing, August 7-8, 2000, San Jose, California, USA

edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid State Circuits Society

Institute of Electrical and Electronics Engieers c2000

:case.

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7

Records of the 1999 International Workshop on Memory Technology, Design and Testing, August 9-10, 1999, San Jose, California, USA

edited by R. Rajsuman, T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with The IEEE Solid-State Circuits Society

Institute of Electrical and Electronics Engieers c1999

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8

Proceedings : International Workshop on Memory Technology, Design and Testing, August 24-25, 1998, San Jose, California, USA

sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]

IEEE Computer Society Press c1998

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9

Proceedings : International Workshop on Memory Technology, Design, and Testing

edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press c1997

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IEEE International Workshop on Memory Technology, Design, and Testing

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