sponsored by IEEE Computer Society Test Technology Technical Council

IEEE Computer Society c1999

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sponsored by IEEE Computer Society Technical Committee on Test Technology, Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuit Society ; edited by D. Lepejian, ... [et al.]

IEEE Computer Society Press c1998

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sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee

IEEE Computer Society c1998

: microfiche

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sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section

IEEE Computer Society c1998

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edited by F. Lombardi, R. Rajsuman, and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press c1997

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sponsored by IEEE Computer Society Test Technology Technical Committee, IEEE Philadelphia Section

IEEE Computer Society Press c1997

: pbk

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edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press c1996

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edited by R. Rajsuman and K. Rajkanan ; sponsored by the IEEE Computer Society Technical Committee on Test Technology, the IEEE Computer Society Technical Committee on VLSI ; in cooperation with the IEEE Solid State Circuits Council

IEEE Computer Society Press c1995

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workshop chair, Nick Kanopoulos, program chair, Rudy Lauwereins, proceedings editor, Rudy Lauwereins ; sponsored by the IEEE Computer Society Technical Committee on Design Automation, the IEEE Computer Society Technical Committee on Test Technology

IEEE Computer Society Press c1995

paper

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edited by R. Rajsuman ; sponsored by IEEE Computer Society Technical Committee on Test Technology in cooperation with the IEEE Computer Society Technical Committee on VLSI

IEEE Computer Society Press c1994

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sponsored by the IEEE Computer Society. Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]

IEEE Computer Society Press c1994

: paper , : microfiche

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sponsored by the IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, Association for Computing Machinery SIGSIM

IEEE Computer Society Press c1994

paper , microfiche

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sponsored by the IEEE Computer Society, Test Technology Technical Committee ; in cooperation with China Computer Federation (CCF), Institute of Computing Technology (ICT), CAS, National Natural Science Foundation of China (NSFC)

IEEE Computer Society Press c1993

: paper , : microfiche

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[edited] by Y.K. Malaiya and R. Rajsuman

IEEE Computer Society Press 1992 IEEE Computer Society Press technology series

: pbk. , : fiche

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sponsored by IEEE Computer Society Test Technology Technical Committee

IEEE Computer Society Press 1992

: microfiche , : hard

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sponsored by the IEEE Computer Society, Test Technology Technical Committee, and IEEE Philadelphia Section

The Society : Institute of Electrical and Electronics Engineers c1992

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sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

IEEE c1991

: soft. , : micro.

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sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

Tokyo : IEEE Computer Society Press c1990

: paper , : microfiche , : case

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Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section

IEEE Computer Society Press , Institute of Electrical and Electronics Engineers, c1989

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sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section

Computer Society Press of the IEEE c1988

paper , microfiche , case

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