Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

• • IEEE International Workshop on Memory Testing
• • Rajsuman, Rochit
• • Swee, Yong-Khim
• • Lau, Lee-Yee
• • IEEE Computer Society. Test Technology Technical Committee
• • IEEE Computer Society. Technical Committee on VLSI
• • IEEE Solid-State Circuits Council

• • IEEE International Workshop on Memory Testing
• • Rajsuman, Rochit
• • Swee, Yong-Khim
• • Lau, Lee-Yee
• • IEEE Computer Society. Test Technology Technical Committee
• • IEEE Computer Society. Technical Committee on VLSI
• • IEEE Solid-State Circuits Council

Records of the 1996 IEEE International Workshop on Memory Technology, Design, and Testing, August 13-14, 1996, Singapore

edited by Rochit Rajsuman, Yong-Khim Swee, Lee-Yee Lau ; sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Council

IEEE Computer Society Press, c1996

タイトル別名

96TB100042

大学図書館所蔵 件 / 全1件

• 東京科学大学 大岡山図書館

  I10650/100042109811874

  OPAC

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• カーリル
• WorldCat

"IEEE catalog number 96TB100042"--T.p. verso

Includes bibliographical references and index