sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology

IEEE Computer Society Press c2000

: pbk

所蔵館5館

sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, Association for Computing Machinery SIGSIM

IEEE Computer Society c1999

所蔵館4館

sponsored by IEEE Computer Society Test Technology Technical Committee, Computer Chapter of IEEE Singapore Section, Singapore Polytechnic ; in cooperation with National University of Singapore, Nanyang Technological University

IEEE Computer Society Press c1998

所蔵館3館

sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, ACM SIGSIM ; proceedings editor, Jürgen Becker ; program chair, Mangred Glesner ; workshop char, Rudy Lauwereins

IEEE Computer Society Press c1998

所蔵館3館

sponsored by IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]

IEEE Computer Society Press c1997

所蔵館4館

edited by Anura P. Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology

IEEE Computer Society Press c1997

所蔵館1館

sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology

IEEE Computer Society Press c1997

所蔵館3館

sponsored by the IEEE Computer Society Technical Committee on Test Technology, National Tsing Hua University

IEEE Computer Society Press c1996

所蔵館2館

edited by Carol Tong, Anura Jayasumana ; sponsored by IEEE Computer Society Technical Committee on Test Technology

IEEE Computer Society Press c1996

所蔵館2館

sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section

IEEE Computer Society Press c1996

所蔵館6館

sponsored by IEEE Computer Society Technical Committee on Simulation, IEEE Computer Society Technical Committee on Test Technology, ACM SIGSIM

IEEE Computer Society Press c1996

所蔵館3館

sponsored by the IEEE Computer Society's Technical Committee on Test Technology and the VLSI Society of India (VSI)

IEEE Computer Society Press c1995

所蔵館3館

sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section

IEEE Computer Society Press c1995

pbk.

所蔵館3館

sponsored by IEEE Computer Society Technical Committee on Test Technology, IEEE Philadelphia Section

IEEE Computer Society Press c1994

: pbk

所蔵館5館

sponsored by the IEEE Computer Society, Technical Committee-Test Technology and the Philadelphia Section of the IEEE

IEEE Computer Society Press c1993

: soft. , : micro.

所蔵館5館