Proceedings : Sixth Asian Test Symposium (ATS '97), November 17-19, 1997, Akita, Japan

書誌事項

Proceedings : Sixth Asian Test Symposium (ATS '97), November 17-19, 1997, Akita, Japan

sponsored by IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]

IEEE Computer Society Press, c1997

タイトル別名

97TB100205

この図書・雑誌をさがす

注記

"IEEE order plan catalog number 97TB100205"

Includes bibliographies and index

内容説明・目次

内容説明

Areas covered in this text include: test generation; design for testability; fault tolerance; case studies for DFT techniques in Japanese industry; test technologies; beam testing of VLSI circuits in Japan; mixed-signal test; novel beam testing techniques in Japan; and current testing.

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