Proceedings : Sixth Asian Test Symposium (ATS '97), November 17-19, 1997, Akita, Japan
sponsored by IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]
IEEE Computer Society Press, c1997
97TB100205
"IEEE order plan catalog number 97TB100205"
Includes bibliographies and index
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