Text ( visual ) : unmediated
Proceedings : Sixth Asian Test Symposium (ATS '97), November 17-19, 1997, Akita, Japan / sponsored by IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Tolerant Systems, IEICE ... [et al.]. -- Los Alamitos, Ca. : IEEE Computer Society Press , c1997. -- xv, 418 p. : ill. ; 28 cm. -- "IEEE order plan catalog number 97TB100205" ; Includes bibliographies and index. -- ISBN 0818682094 ; (BA43673663) ; https://ci.nii.ac.jp/ncid/BA43673663
Other Title(s): 97TB100205. -- Author Heading(s): Asian Test Symposium ; IEEE Computer Society. Technical Committee on Test Technology. -- Classification(s): LCC : TK7874 ; DC20 : 621.381/548. -- Subject Heading(s): LCSH : Integrated circuits -- Testing -- Congresses ; LCSH : Automatic test equipment -- Congresses
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