IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

ID:DA1185577X

別名: International Symposium on Defect and Fault Tolerance in VLSI Systems, IEEE

Symposium on Defect and Fault Tolerance in VLSI Systems, IEEE International

DFT

IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

関連著者名: International Workshop on Defect and Fault Tolerance in VLSI Systems

同姓同名の著者を検索

検索結果11件中 1-11 を表示

1

Proceedings : the 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : Boston, Massachusetts 1-3 October 2008

edited by Cristiana Bolchini ... [et al.]

IEEE Computer Society c2008
2

Proceedings : the 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems : DFT 2007 : 26-28 September 2007, Rome, Italy

edited by Cristiana Bolchini ... [et al.]

IEEE Computer Society [c2007]
3

Proceedings : 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 4-6 October, 2006, Arlington, Virginia, USA

edited by Nohpill Park ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)

IEEE Computer Society c2006
4

DFT 2005 : 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 October, 2005, Monterey, California, USA

edited by Robert Aitken ... [et al.] ; sponsored by the IEEE Computer Society Test Technology Technical Council (TTTC), the IEEE Computer Society Technical Committee on Fault-Tolerant Computing(TCFTC)

IEEE Computer Society c2005

所蔵館1館
5

Proceedings : 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 10-13 October 2004, Cannes, France

[edited by R. Aitken, ... [et al.] ] ; sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing (TCFTC), IEEE Computer Society Test Technology Technical Council (TTTC)

IEEE Computer Society c2004

所蔵館3館
6

Proceedings, 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 3-5 November 2003, Boston, Massachusetts

[edited by C. Bolchini ... [et al.] ] ; sponsored by the Counci the IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technicall

IEEE Computer Society c2003

所蔵館2館
7

Proceedings, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2002, 6-8 November 2002, Vancouver, BC, Canada

[sponsored by the IEEE Computer Society Test Technology Technical Council, the IEEE Computer Society Technical Committee on Fault-Tolerant Computing]

IEEE Computer Society c2002

所蔵館2館
8

Proceedings, 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 24-26 October, 2001, San Francisco, California

sponsored by IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council

IEEE Computer Society c2001

: case

所蔵館3館
9

Proceedings, IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 25-27 October, 2000, Yamanashi, Japan

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee ; in cooperation with Technical Group on Fault Torerant Systems, IEICE, Japan

IEEE Computer Society c2000

: case

所蔵館5館
10

Proceedings : 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 1-3, 1999, Albuquerque, New Mexico

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Council

IEEE Computer Society c1998

: microfiche

所蔵館3館
11

Proceedings : 1998 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, November 2-4, 1998, Austin, Texas

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on Fault-Tolerant Computing, IEEE Computer Society Test Technology Technical Committee

IEEE Computer Society c1998

: microfiche

所蔵館1館

IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

検索結果11件中 1-11 を表示

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