Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA

• • IEEE International Workshop on Memory Technology, Design, and Testing
• • Zorian, Yervant
• • Courtois, B. (Bernard)
• • Wik, Thomas
• • Cockburn, Bruce
• • IEEE Computer Society
• • IEEE Computer Society. Test Technology Technical Council
• • IEEE Computer Society. Technical Committee on VLSI
• • IEEE Solid-State Circuits Society

• • IEEE International Workshop on Memory Technology, Design, and Testing
• • Zorian, Yervant
• • Courtois, B. (Bernard)
• • Wik, Thomas
• • Cockburn, Bruce
• • IEEE Computer Society
• • IEEE Computer Society. Test Technology Technical Council
• • IEEE Computer Society. Technical Committee on VLSI
• • IEEE Solid-State Circuits Society

Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA

editors, Yervant Zorian ... [et al.] ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid State Circuits Society

IEEE Computer Society, c2001

• : case

タイトル別名

PR01242

Records of the 2001 IEEE International Workshop on Memory Technology, Design and Testing

大学図書館所蔵 件 / 全1件

• 東京科学大学 大岡山図書館

  I10625/1242100106426

  OPAC

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• WorldCat

"IEEE Computer Society Order Number PR01242" -- T. p. verso

Includes bibliographical references and index

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