@book{ BA53591736, author = "IEEE International Workshop on Memory Technology, Design, and Testing and Zorian, Yervant and Courtois, B. (Bernard) and Wik, Thomas and Cockburn, Bruce and IEEE Computer Society and IEEE Computer Society. Test Technology Technical Council and IEEE Computer Society. Technical Committee on VLSI and IEEE Solid-State Circuits Society", title = "Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA", publisher = "IEEE Computer Society", year = "2001", URL = "https://ci.nii.ac.jp/ncid/BA53591736" }