TY - BOOK AU - IEEE International Workshop on Memory Technology, Design, and Testing AU - Zorian, Yervant AU - Courtois, B. (Bernard) AU - Wik, Thomas AU - Cockburn, Bruce AU - IEEE Computer Society AU - IEEE Computer Society. Test Technology Technical Council AU - IEEE Computer Society. Technical Committee on VLSI AU - IEEE Solid-State Circuits Society TI - Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA PB - IEEE Computer Society PY - 2001 EP - viii, 108 p. UR - https://ci.nii.ac.jp/ncid/BA53591736 SN - 0769512429 SN - 0769512437 ER -