%A IEEE International Workshop on Memory Technology, Design, and Testing
%A Zorian, Yervant
%A Courtois, B. (Bernard)
%A Wik, Thomas
%A Cockburn, Bruce
%A IEEE Computer Society
%A IEEE Computer Society. Test Technology Technical Council
%A IEEE Computer Society. Technical Committee on VLSI
%A IEEE Solid-State Circuits Society
%T Proceedings, 2001 IEEE International Workshop on Memory Technology, Design and Testing, August 6-7, 2001, San Jose, California, USA
%I IEEE Computer Society
%D 2001
%U https://ci.nii.ac.jp/ncid/BA53591736
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