@book{ BA80823517,
 author = "IEEE International Workshop on Memory Technology, Design, and Testing and IEEE Computer Society. Test Technology Technical Council and 清華大学",
 title = "2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan",
 publisher = "IEEE Computer Society",
 year = "2005",
 URL = "https://ci.nii.ac.jp/ncid/BA80823517"
}
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