Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

• • IEEE International Workshop on Memory Technology, Design, and Testing
• • Courtois, B. (Bernard)
• • Wik, T. (Thomas)
• • Zorian, Yervant
• • IEEE Computer Society
• • IEEE Computer Society. Technical Committee on VLSI
• • IEEE Computer Society. Test Technology Technical Council
• • IEEE Solid-State Circuits Society

• • IEEE International Workshop on Memory Technology, Design, and Testing
• • Courtois, B. (Bernard)
• • Wik, T. (Thomas)
• • Zorian, Yervant
• • IEEE Computer Society
• • IEEE Computer Society. Technical Committee on VLSI
• • IEEE Computer Society. Test Technology Technical Council
• • IEEE Solid-State Circuits Society

Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France

editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society

IEEE Computer Society, c2002

• : bookbroker

Other Title

Memory technology, design and testing

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• 東京科学大学 大岡山図書館

  I10625/1617100205475

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"IEEE Computer Society Order Number PR01617"--T.p. verso

"... 10th anniversary of the Workshop ..."--P. x

Includes bibliographical references and index

Also available via the World Wide Web

Volume

ISBN 9780769516172

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Volume

: bookbroker ISBN 9780769516189

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by "Nielsen BookData"