@book{ BA64790086,
 author = "IEEE International Workshop on Memory Technology, Design, and Testing and Courtois, B. (Bernard) and Wik, T. (Thomas) and Zorian, Yervant and IEEE Computer Society and IEEE Computer Society. Technical Committee on VLSI and IEEE Computer Society. Test Technology Technical Council and IEEE Solid-State Circuits Society",
 title = "Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France",
 publisher = "IEEE Computer Society",
 year = "2002",
 URL = "https://ci.nii.ac.jp/ncid/BA64790086"
}
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