TY - BOOK AU - IEEE International Workshop on Memory Technology, Design, and Testing AU - Courtois, B. (Bernard) AU - Wik, T. (Thomas) AU - Zorian, Yervant AU - IEEE Computer Society AU - IEEE Computer Society. Technical Committee on VLSI AU - IEEE Computer Society. Test Technology Technical Council AU - IEEE Solid-State Circuits Society TI - Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France PB - IEEE Computer Society PY - 2002 EP - xii, 182 p. UR - https://ci.nii.ac.jp/ncid/BA64790086 SN - 0769516173 SN - 0769516181 ER -