%A IEEE International Workshop on Memory Technology, Design, and Testing
%A Courtois, B. (Bernard)
%A Wik, T. (Thomas)
%A Zorian, Yervant
%A IEEE Computer Society
%A IEEE Computer Society. Technical Committee on VLSI
%A IEEE Computer Society. Test Technology Technical Council
%A IEEE Solid-State Circuits Society
%T Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France
%I IEEE Computer Society
%D 2002
%U https://ci.nii.ac.jp/ncid/BA64790086
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