Text ( visual ) : unmediated Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France / editors, Bernard Courtois, Thomas Wik, Yervant Zorian ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society. -- : bookbroker. -- Los Alamitos, Calif. : IEEE Computer Society , c2002. -- xii, 182 p. : ill. ; 28 cm. -- "IEEE Computer Society Order Number PR01617"--T.p. verso ; "... 10th anniversary of the Workshop ..."--P. x ; Includes bibliographical references and index ; Also available via the World Wide Web. -- ISBN 0769516173 ; 0769516181 ; (BA64790086) ; https://ci.nii.ac.jp/ncid/BA64790086 Other Title(s): Memory technology, design and testing. -- Author Heading(s): IEEE International Workshop on Memory Technology, Design, and Testing ; Courtois, B. (Bernard) ; Wik, T. (Thomas) ; Zorian, Yervant ; IEEE Computer Society ; IEEE Computer Society. Technical Committee on VLSI ; IEEE Computer Society. Test Technology Technical Council ; IEEE Solid-State Circuits Society. -- Classification(s): LCC : TK7895.M4. -- Subject Heading(s): LCSH : Semiconductor storage devices -- Testing -- Congresses ; LCSH : Random access memory -- Congresses