Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

• • IEEE International Workshop on Memory Technology, Design, and Testing
• • Singh, Adit
• • Wik, Thomas
• • Rajsuman, Rochit
• • IEEE Computer Society
• • IEEE Computer Society. Test Technology Technical Council
• • IEEE Computer Society. Technical Committee on VLSI
• • IEEE Solid-State Circuits Society

• • IEEE International Workshop on Memory Technology, Design, and Testing
• • Singh, Adit
• • Wik, Thomas
• • Rajsuman, Rochit
• • IEEE Computer Society
• • IEEE Computer Society. Test Technology Technical Council
• • IEEE Computer Society. Technical Committee on VLSI
• • IEEE Solid-State Circuits Society

Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California

sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with IEEE Solid State Circuits Society ; [edited by Tom Wik, Adit Singh, and Rochit Rajsuman]

IEEE Computer Society, c2003

Other Title

PR02004

MTDT 2003

Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing

Available at  / 2 libraries

• 東京科学大学 大岡山図書館

  I10625/2004130912192

  OPAC

• 龍谷大学 瀬田図書館 図

  30300118483

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"IEEE Computer Society Order Number PR02004" -- T. p. verso

Includes bibliographical references and index

Description

by "Nielsen BookData"