TY - BOOK
AU - IEEE International Workshop on Memory Technology, Design, and Testing
AU - Singh, Adit
AU - Wik, Thomas
AU - Rajsuman, Rochit
AU - IEEE Computer Society
AU - IEEE Computer Society. Test Technology Technical Council
AU - IEEE Computer Society. Technical Committee on VLSI
AU - IEEE Solid-State Circuits Society
TI - Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California
PB - IEEE Computer Society
PY - 2003
EP - ix, 95 p.
UR - https://ci.nii.ac.jp/ncid/BA65806250
SN - 0769520049
ER -
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