%A IEEE International Workshop on Memory Technology, Design, and Testing
%A Singh, Adit
%A Wik, Thomas
%A Rajsuman, Rochit
%A IEEE Computer Society
%A IEEE Computer Society. Test Technology Technical Council
%A IEEE Computer Society. Technical Committee on VLSI
%A IEEE Solid-State Circuits Society
%T Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California
%I IEEE Computer Society
%D 2003
%U https://ci.nii.ac.jp/ncid/BA65806250
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