@book{ BA65806250,
 author = "IEEE International Workshop on Memory Technology, Design, and Testing and Singh, Adit and Wik, Thomas and Rajsuman, Rochit and IEEE Computer Society and IEEE Computer Society. Test Technology Technical Council and IEEE Computer Society. Technical Committee on VLSI and IEEE Solid-State Circuits Society",
 title = "Records of the 2003 International Workshop on Memory Technology, Design and Testing, 28-29 July 2003, San Jose, California",
 publisher = "IEEE Computer Society",
 year = "2003",
 URL = "https://ci.nii.ac.jp/ncid/BA65806250"
}
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