Board and system test track

• • International Test Conference
• • IEEE Computer Society. Test Technology Technical Council
• • Institute of Electrical and Electronics Engineers. Philadelphia Section

• 関連文献: 1件

• • International Test Conference
• • IEEE Computer Society. Test Technology Technical Council
• • Institute of Electrical and Electronics Engineers. Philadelphia Section

Board and system test track

[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]

(Proceedings : International Test Conference 2003 / [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section])

International Test Conference, c2003

タイトル別名

Proceedings : Board and system test track : International Test Conference 2003

International Test Conference 2003 : Proceedings : Board and system test track : September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA

大学図書館所蔵 件 / 全4件

• 愛媛大学 図書館 研

  549.7||IN||2003(2)0312004018616

  京都産業大学 図書館

  549.7

  拓殖大学 八王子図書館

  549.7||2003-2||301400636776

  広島市立大学 附属図書館

  0002752662

  該当する所蔵館はありません
• すべての絞り込み条件を解除する

• カーリル
• WorldCat

IEEE Catalog Number: 03CH37494

Includes bibliographical references and index

関連文献: 1件中  1-1を表示

• 1

  Proceedings : International Test Conference 2003

  [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]

  International Test Conference c2003

  所蔵館6館