%A International Test Conference
%A IEEE Computer Society. Test Technology Technical Council
%A Institute of Electrical and Electronics Engineers. Philadelphia Section
%T Board and system test track
%I International Test Conference
%D 2003
%S Proceedings : International Test Conference 2003 / [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]
%V 
%U https://ci.nii.ac.jp/ncid/BA65459044
</div><div class="naked_ctrl">
<form action="/index.cgi/contrast" method="get" name="gate">
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/ <label>アドレス: <input type="text" name="naked_post_url" value="https://ci.nii.ac.jp:443/ncid/BA65459044.bix" size="22" /></label> <label>モード: <select name="naked_post_mode">
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