Text ( visual ) : unmediated Board and system test track / [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]. -- Washington, D.C. : International Test Conference , c2003. -- ii, 216 p. : ill. ; 28 cm. -- (Proceedings : International Test Conference 2003 / [sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]). -- IEEE Catalog Number: 03CH37494 ; Includes bibliographical references and index. -- ISBN 0780381068 ; (BA65459044) ; https://ci.nii.ac.jp/ncid/BA65459044 Other Title(s): Proceedings : Board and system test track : International Test Conference 2003 ; International Test Conference 2003 : Proceedings : Board and system test track : September 30-October 2, 2003, Charlotte Convention Center, Charlotte, NC, USA. -- Author Heading(s): International Test Conference ; IEEE Computer Society. Test Technology Technical Council ; Institute of Electrical and Electronics Engineers. Philadelphia Section