Re: Smart

# smartctl /dev/sda -a
smartctl 5.41 2011年06月09日 r3365 [i686-linux-3.2.0-4-686-pae] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Intel 320 Series SSDs
Device Model: INTEL SSDSA2CW120G3
Serial Number: BTPR143000J7120LGN
LU WWN Device Id: 5 001517 a6be87e74
Firmware Version: 4PC10362
User Capacity: 120,034,123,776 bytes [120 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: ATA-8-ACS revision 4
Local Time is: Fri Aug 29 21:06:48 2014 UTC
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
 was never started.
 Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
 without error or no self-test has ever 
 been run.
Total time to complete Offline 
data collection: ( 1) seconds.
Offline data collection
capabilities: (0x75) SMART execute Offline immediate.
 No Auto Offline data collection support.
 Abort Offline collection upon new
 command.
 No Offline surface scan supported.
 Self-test supported.
 Conveyance Self-test supported.
 Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
 power-saving mode.
 Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
 General Purpose Logging supported.
Short self-test routine 
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 1) minutes.
Conveyance self-test routine
recommended polling time: ( 1) minutes.
SCT capabilities: (0x003d) SCT Status supported.
 SCT Error Recovery Control supported.
 SCT Feature Control supported.
 SCT Data Table supported.
SMART Attributes Data Structure revision number: 5
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
 3 Spin_Up_Time 0x0020 100 100 000 Old_age Offline - 0
 4 Start_Stop_Count 0x0030 100 100 000 Old_age Offline - 0
 5 Reallocated_Sector_Ct 0x0032 100 100 000 Old_age Always - 0
 9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 22667
 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 141
170 Reserve_Block_Count 0x0033 100 100 010 Pre-fail Always - 0
171 Program_Fail_Count 0x0032 100 100 000 Old_age Always - 0
172 Erase_Fail_Count 0x0032 100 100 000 Old_age Always - 0
183 Runtime_Bad_Block 0x0030 100 100 000 Old_age Offline - 1427
184 End-to-End_Error 0x0032 100 100 090 Old_age Always - 0
187 Reported_Uncorrect 0x0032 100 100 000 Old_age Always - 0
192 Unsafe_Shutdown_Count 0x0032 100 100 000 Old_age Always - 114
199 UDMA_CRC_Error_Count 0x0030 100 100 000 Old_age Offline - 0
225 Host_Writes_32MiB 0x0032 100 100 000 Old_age Always - 418196
226 Workld_Media_Wear_Indic 0x0032 100 100 000 Old_age Always - 2619
227 Workld_Host_Reads_Perc 0x0032 100 100 000 Old_age Always - 99
228 Workload_Minutes 0x0032 100 100 000 Old_age Always - 34914971
232 Available_Reservd_Space 0x0033 100 100 010 Pre-fail Always - 0
233 Media_Wearout_Indicator 0x0032 098 098 000 Old_age Always - 0
241 Host_Writes_32MiB 0x0032 100 100 000 Old_age Always - 418196
242 Host_Reads_32MiB 0x0032 100 100 000 Old_age Always - 1675252
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Reserved (0x10) Completed without error 00% 22667 -
# 2 Reserved (0x38) Completed without error 00% 22664 -
# 3 Reserved (0x20) Completed without error 00% 22664 -
Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
 1 0 0 Not_testing
 2 0 0 Not_testing
 3 0 0 Not_testing
 4 0 0 Not_testing
 5 0 0 Not_testing
Selective self-test flags (0x0):
 After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

J’avais lancé trois tests avant de perdre mon (削除) disque (削除ここまで)SSD, deux short et un long si je ne m’abuse (mais tous prenaient 1′). Si y’a besoin d’une autre commande SMART, je peux l’exécuter sans problèmes.