2016 IEEE International Test Conference : (ITC 2016) : Fort Worth, Texas, USA, 15-17 November 2016
Bibliographic Information
2016 IEEE International Test Conference : (ITC 2016) : Fort Worth, Texas, USA, 15-17 November 2016
IEEE, c2016
- Other Title
-
CFP16ITC-POD
Available at / 1 libraries
-
Note
"IEEE catalog number: CFP16ITC-POD"
Includes bibliographical references
Details
- NCID
- BB2513445X
- ISBN
- Country Code
- us
- Title Language Code
- eng
- Text Language Code
- eng
- Place of Publication
- Piscataway, N.J.
- Pages/Volumes
- 490 p.
- Size
- 28 cm
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