@book{ BB2513445X,
 author = "International Test Conference and Institute of Electrical and Electronics Engineers",
 title = "2016 IEEE International Test Conference : (ITC 2016) : Fort Worth, Texas, USA, 15-17 November 2016",
 publisher = "IEEE",
 year = "2016",
 URL = "https://ci.nii.ac.jp/ncid/BB2513445X"
}
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