[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section]

International Test Conference c1999

: soft , : case , : microfiche

所蔵館7館

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]

International Test Conference c1998

: soft , : case , : microfiche

所蔵館8館

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]

International Test Conference c1997

: soft , : case , :microfiche , :CD-ROM

所蔵館6館

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]

International Test Conference c1996

: soft , : case , :microfiche , :CD-ROM

所蔵館9館

International Test Conference c1995

: soft , : case , : microfiche

所蔵館6館

edited by Paul H. Bardell ... [et al.]

IEEE Computer Society Press c1994

所蔵館8館

International Test Conference c1994

: soft , : case

所蔵館10館

[sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia section]

International Test Conference c1993

: soft , : case

所蔵館11館

[sponsored by the IEEE Computer Society Test Technology Techinical Committee and IEEE Philadelphia Section]

International Test Conference c1992

: soft. , : case. , : micro.

所蔵館9館

International Test Conference c1991

: library binding , : microfiche , : casebound

所蔵館7館

sponsored by the IEEE Computer Society, Test Technology Technical Committee and IEEE Philadelphia Section

Tokyo : IEEE Computer Society Press c1990

: paper , : microfiche , : case

所蔵館4館

Sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section

IEEE Computer Society Press , Institute of Electrical and Electronics Engineers, c1989

所蔵館5館

sponsored by the Computer Society of the IEEE, Test Technology Technical Committee and IEEE Philadelphia Section

Computer Society Press of the IEEE c1988

paper , microfiche , case

所蔵館4館

sponsored by the IEEE Computer Society, IEEE Philadelphia Section

Computer Society Press of the IEEE , Order from Computer Society of the IEEE c1987

pbk. , microfiche , case

所蔵館2館

sponsored by the IEEE Computer Society [and] IEEE Philadelphia Section

IEEE Computer Society Press c1986

pbk. , microfiche , hard

所蔵館3館

sponsored by the IEEE Computer Society, IEEE Philadelphia Section

IEEE Computer Society Press , Order from IEEE Computer Society 1985

pbk. , hard , microfiche

所蔵館3館

sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section

IEEE Computer Society Press c1984

pbk. , microfiche , hard

所蔵館1館

sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section

IEEE Computer Society Press 1983

所蔵館1館

presented by the Test Technology Committee, the International Test Formation [i.e. Foundation] ; sponsored by IEEE Computer Society, IEEE Philadelphia Section

IEEE Computer Society Press c1982

所蔵館1館

sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , order from IEEE Computer Society c1981

所蔵館1館