sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI

IEEE Computer Society c2003

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sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI

IEEE Computer Society Press c1999

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sponsored by IEEE Computer Society Technical Committee on Design Automation, IEEE Computer Society Technical Committee on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with Association for Computing Machinery (ACM), the American Society for Engineering Education (ASEE) ; support provided by National Science Foundation, Semiconductor Research Corporation

IEEE Computer Society Press c1997

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IEEE Computer Society Press 1990]

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IEEE 1985 Workshop on Simulation & Test Generation Environments, September 17 & 18, 1985, San Francisco, California ; sponsors, IEEE Computer Society, Test Technology Committee

IEEE Computer Society Press , Order from IEEE Computer Society c1986

pbk. , hard , microfiche

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sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section

IEEE Computer Society Press c1984

pbk. , microfiche , hard

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sponsored by the IEEE Computer Society, Test Technology Committee, IEEE Philadelphia Section

IEEE Computer Society Press 1983

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presented by the Test Technology Committee, the International Test Formation [i.e. Foundation] ; sponsored by IEEE Computer Society, IEEE Philadelphia Section

IEEE Computer Society Press c1982

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sponsored by the IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , order from IEEE Computer Society c1981

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sponsored by IEEE Computer Society, Test Technology Committee [and] Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , available from IEEE Computer Society Publications Office c1980

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sponsored by IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , available from IEEE Computer Society Publications Office c1979

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sponsored by IEEE Computer Society, Test Technology Committee and the Philadelphia Section of the IEEE

Institute of Electrical and Electronics Engineers , available from IEEE Computer Society Publications Office c1978

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