Analytical Sciences


Table of Contents − Volume 21, Number 7 (2005)

Rapid Communications

Poly(amide amine) Dendrimer with Naphthyl Units as a Fluorescent Chemosensor for Metal Ions
J. KAWAKAMI, T. ISOBE, Y. SASAKI, S. ITO, M. NAGAKI, and H. KITAHARA
Analytical Sciences, 2005, 21(7), 729.
DOI: 10.2116/analsci.21.729
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Special Issue − X-ray Chemical Analysis
Guest Editorial
J. KAWAI
Analytical Sciences, 2005, 21(7), 731.
DOI: 10.2116/analsci.21.731
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Reviews

Radiative Auger Effect and Extended X-Ray Emission Fine Structure (EXEFS)
J. KAWAI
Analytical Sciences, 2005, 21(7), 733.
DOI: 10.2116/analsci.21.733
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Quality Assurance Challenges in X-ray Emission Based Analyses, the Advantage of Digital Signal Processing
T. PAPP, A. T. PAPP, and J. A. MAXWELL
Analytical Sciences, 2005, 21(7), 737.
DOI: 10.2116/analsci.21.737
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Original Papers

Study of Heavy Metals in Wild Edible Mushrooms under Different Pollution Conditions by X-Ray Fluorescence Spectrometry
M. L. CARVALHO, A. C. PIMENTEL, and B. FERNANDES
Analytical Sciences, 2005, 21(7), 747.
DOI: 10.2116/analsci.21.747
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Soil Characterization by Energy Dispersive X-Ray Fluorescence: Sampling Strategy for in situ Analysis
G. CUSTO, S. BOEYKENS, L. DAWIDOWSKI, L. FOX, D. GÓMEZ, F. LUNA, and C. VÁZQUEZ
Analytical Sciences, 2005, 21(7), 751.
DOI: 10.2116/analsci.21.751
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Effect of Energy Dependence of Primary Beam Divergence on the X-ray Standing Wave Characterization of Layered Materials
M. K. TIWARI, S. R. NAIK, G. S. LODHA, and R. V. NANDEDKAR
Analytical Sciences, 2005, 21(7), 757.
DOI: 10.2116/analsci.21.757
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Elucidating a Particulate Matter Deposition Episode by Combining Scanning Electron Microscopy and X-Ray Fluorescence Spectrometry
C. VÁZQUEZ, G. CUSTO, L. DAWIDOWSKI, D. GÓMEZ, M. VILLEGAS, M. ORTIZ, and M. MIYAGUSUKU
Analytical Sciences, 2005, 21(7), 763.
DOI: 10.2116/analsci.21.763
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Determination of Chemical Form of Antimony in Contaminated Soil around a Smelter Using X-ray Absorption Fine Structure
M. TAKAOKA, S. FUKUTANI, T. YAMAMOTO, M. HORIUCHI, N. SATTA, N. TAKEDA, K. OSHITA, M. YONEDA, S. MORISAWA, and T. TANAKA
Analytical Sciences, 2005, 21(7), 769.
DOI: 10.2116/analsci.21.769
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Evaluation of a Quantitative Method for Trace Impurities in Arsenous Acids by Synchrotron Radiation X-ray Fluorescence Spectrometry and Inductively Coupled Plasma-Atomic Emission Spectrometry
S. SUZUKI, Y. SUZUKI, H. OHTA, M. KASAMATSU, and T. NAKANISHI
Analytical Sciences, 2005, 21(7), 775.
DOI: 10.2116/analsci.21.775
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Excitation Energy Dependence for the Li 1s X-ray Photoelectron Spectra of LiMn2O4
J. TSUJI, M. FUJITA, Y. HARUYAMA, K. KANDA, S. MATSUI, N. OZAWA, T. YAO, and K. TANIGUCHI
Analytical Sciences, 2005, 21(7), 779.
DOI: 10.2116/analsci.21.779
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X-ray Absorption Spectral Analysis with a 9 V Battery X-ray Generator
H. ISHII and J. KAWAI
Analytical Sciences, 2005, 21(7), 783.
DOI: 10.2116/analsci.21.783
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Nondestructive Analysis of Silver in Gold Foil Using Synchrotron Radiation X-ray Fluorescence Spectrometry
M. KASAMATSU, Y. SUZUKI, T. NAKANISHI, O. SHIMODA, Y. NISHIWAKI, N. MIYAMOTO, and S. SUZUKI
Analytical Sciences, 2005, 21(7), 785.
DOI: 10.2116/analsci.21.785
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The Effect of UV Irradiation on the Reduction of Au(III) Ions Adsorbed on Manganese Dioxide
H. OHASHI, H. EZOE, Y. OKAUE, Y. KOBAYASHI, S. MATSUO, T. KURISAKI, A. MIYAZAKI, H. WAKITA, and T. YOKOYAMA
Analytical Sciences, 2005, 21(7), 789.
DOI: 10.2116/analsci.21.789
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Rapid Identification of Inorganic Salts Using Energy Dispersive X-Ray Fluorescence
J. BLANC, S. POPULAIRE, and L. PERRING
Analytical Sciences, 2005, 21(7), 795.
DOI: 10.2116/analsci.21.795
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Grazing-Exit and Micro X-ray Fluorescence Analyses for Chemical Microchips
K. TSUJI, T. EMOTO, Y. NISHIDA, E. TAMAKI, Y. KIKUTANI, A. HIBARA, and T. KITAMORI
Analytical Sciences, 2005, 21(7), 799.
DOI: 10.2116/analsci.21.799
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Pre-edge Features of Ti K-edge X-ray Absorption Near-edge Structure for the Local Structure of Sol-Gel Titanium Oxides
S. MATSUO, N. SAKAGUCHI, and H. WAKITA
Analytical Sciences, 2005, 21(7), 805.
DOI: 10.2116/analsci.21.805
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Numerical Simulation of C/C/C Planar X-ray Waveguides
P. KARIMOV, J. KAWAI, and E. Z. KURMAEV
Analytical Sciences, 2005, 21(7), 811.
DOI: 10.2116/analsci.21.811
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X-ray Fluorescence Analysis of Rare Earth Elements in Rocks Using Low Dilution Glass Beads
K. NAKAYAMA and T. NAKAMURA
Analytical Sciences, 2005, 21(7), 815.
DOI: 10.2116/analsci.21.815
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Complexing Membrane for Uranium Detection by Total Reflection X-Ray Fluorescence
V. HATZISTAVROS, P. KOULOURIDAKIS, and N. KALLITHRAKAS-KONTOS
Analytical Sciences, 2005, 21(7), 823.
DOI: 10.2116/analsci.21.823
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Determination of Trace Elements in Sediment Reference Materials by Monochromatic X-ray Excitation X-ray Fluorescence Spectrometry
M. KURAHASHI, J. MIZUTANI, and A. HIOKI
Analytical Sciences, 2005, 21(7), 827.
DOI: 10.2116/analsci.21.827
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X-Ray Powder Diffraction Patterns for Certain β-Lactam, Tetracycline and Macrolide Antibiotic Drugs
S. THANGADURAI, J. T. ABRAHAM, A. K. SRIVASTAVA, M. NATARAJA MOORTHY, S. K. SHUKLA, and Y. ANJANEYULU
Analytical Sciences, 2005, 21(7), 833.
DOI: 10.2116/analsci.21.833
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Investigation of Individual Micrometer-Size Kosa Particle with On-Site Combination of Electron Microscope and Synchrotron X-Ray Microscope
Y. TANAKA, Y. TANIGUCHI, D. TANAKA, M. TOYODA, H. ISHII, T. TANABE, Y. TERADA, S. HAYAKAWA, and J. KAWAI
Analytical Sciences, 2005, 21(7), 839.
DOI: 10.2116/analsci.21.839
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Grazing Incidence-X-ray Fluorescence Spectrometry for the Compositional Analysis of Nanometer-Thin High-κ Dielectric HfO2 Layers
D. HELLIN, A. DELABIE, R. L. PUURUNEN, P. BEAVEN, T. CONARD, B. BRIJS, S. D. GENDT, and C. VINCKIER
Analytical Sciences, 2005, 21(7), 845.
DOI: 10.2116/analsci.21.845
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Simultaneous Determination of Cobalt, Copper and Zinc by Energy Dispersive X-ray Fluorescence Spectrometry after Preconcentration on PAR-loaded Ion-Exchange Resin
Z.-T. JIANG, J. C. YU, and H.-Y. LIU
Analytical Sciences, 2005, 21(7), 851.
DOI: 10.2116/analsci.21.851
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Forensic Discrimination of Sheet Glass by a Refractive-Index Measurement and Elemental Analysis with Synchrotron Radiation X-ray Fluorescence Spectrometry
Y. SUZUKI, M. KASAMATSU, S. SUZUKI, T. NAKANISHI, M. TAKATSU, S. MURATSU, O. SHIMODA, S. WATANABE, Y. NISHIWAKI, and N. MIYAMOTO
Analytical Sciences, 2005, 21(7), 855.
DOI: 10.2116/analsci.21.855
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Valence Determination of Manganese in Battery Cathode Materials by High-Resolution Mn Kα1 Spectra
T. KONISHI, T. TSUBATA, M. OKU, Y. M. TODOROV, and M. YOSHIO
Analytical Sciences, 2005, 21(7), 861.
DOI: 10.2116/analsci.21.861
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Chemical Effects in High-Resolution Nickel Kα X-Ray Fluorescence Spectra
J. KAWAI, M. OHTA, and T. KONISHI
Analytical Sciences, 2005, 21(7), 865.
DOI: 10.2116/analsci.21.865
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Test Method for the Presence or Absence of Pb in Electrical Components Using Energy-Dispersive Micro X-ray Fluorescence
W. ARAKI, K. MIZOROKI, M. OKI, and M. TAKENAKA
Analytical Sciences, 2005, 21(7), 869.
DOI: 10.2116/analsci.21.869
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Environmental Trace-Element Analysis Using a Benchtop Total Reflection X-Ray Fluorescence Spectrometer
H. STOSNACH
Analytical Sciences, 2005, 21(7), 873.
DOI: 10.2116/analsci.21.873
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Strong X-Ray Emission from Electrified Insulators
N. INADA, K. MAEDA, and J. KAWAI
Analytical Sciences, 2005, 21(7), 877.
DOI: 10.2116/analsci.21.877
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A Simple X-Ray Emitter
H. MURAKAMI, R. ONO, A. HIRAI, Y. HOSOKAWA, and J. KAWAI
Analytical Sciences, 2005, 21(7), 881.
DOI: 10.2116/analsci.21.881
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The Role of Trace Metallic Elements in Neurodegenerative Disorders: Quantitative Analysis Using XRF and XANES Spectroscopy
A. IDE-EKTESSABI and M. RABIONET
Analytical Sciences, 2005, 21(7), 885.
DOI: 10.2116/analsci.21.885
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Announcements

Analytical Sciences, 2005, 21(7), 893.
DOI: 10.2116/analsci.21.893
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