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第六届中国研究生创"芯"·EDA 精英挑战赛 赛题四:多层图形匹配与设计单元级版图验证算法

  • 目前完成的部分在rtree.cpp里,静态编译后的可执行文件是pm,可以按照下面的命令试一试能不能运行(txt文件要对应)
./pm -layout ./testset/small/small_layout.txt -lib ./testset/small/small_pattern.txt
  • 暂时还未实现xor的准确输出,所有关键曼哈顿图形的搜索,以及输出文件保存

可参考开源库:

  1. 曼哈顿图形异或操作库:polyops

可参考文献

23年广立微赛题相关

Edge Pair-Based Layout Pattern Matching using Space-filling Curve | IEEE Conference Publication | IEEE Xplore

  • 一等奖团队论文

Pattern Match in VLSI Layout with Window Dance | IEEE Conference Publication | IEEE Xplore

  • 二等奖团队论文 专利

官方赛题文件提供的参考文献

H. Yao, S. Sinha, C. Chiang, X. Hong and Y. Cai, "Efficient Process-Hotspot Detection Using Range Pattern Matching," 2006 IEEE/ACM International Conference on Computer Aided Design, San Jose, CA, USA, 2006, pp. 625-632, doi:10.1109/ICCAD.2006.320026.

  • 提取拓扑结构,可用于初步的模糊匹配排除不可能的情况,但细网格划分会导致数据量大

J. W. Park, R. Todd and X. Song, "Geometric Pattern Match Using Edge Driven Dissected Rectangles and Vector Space," in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 35, no. 12, pp. 2046-2055, 2016, doi:10.1109/TCAD.2016.2535908.

  • 将曼哈顿图像进一步划分为矩形,储存向量(角度+距离),象限位置,到总边界框的距离,宽度与高度等空间信息,可减少旋转与镜像迭代次数,

Izumi Nitta, Yuzi Kanazawa, Tsutomu Ishida, and Koji Banno "A fuzzy pattern matching method based on graph kernel for lithography hotspot detection", Proc. SPIE 10148, Design-Process-Technology Co-optimization for Manufacturability XI,101480U (28 March 2017); https://doi.org/10.1117/12.2257654

Uwe Paul Schroeder, Janam Bakshi, Ahmed Mounir Elsemary, and Fadi Batarseh "Dynamic pattern matching flow to enable low escape rate weak point detection", Proc. SPIE 11328, Design-Process-Technology Co-optimization for Manufacturability XIV, 113280D (23 March 2020); https://doi.org/10.1117/12.2551739

Piyush Verma, Fadi Batarseh, Shikha Somani, Jingyu Wang, Sarah McGowan, and Sriram Madhavan "Pattern-based pre-OPC operation to improve model-based OPC runtime", Proc. SPIE 9235, Photomask Technology 2014, 923506 (8 October 2014); https://doi.org/10.1117/12.2068998

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第六届中国研究生创"芯"·EDA 精英挑战赛 赛题四:多层图形匹配与设计单元级版图验证算法

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