Proceedings : 25th IEEE VLSI Test Symposium : 6-10 May, 2007, Berkeley, California
[sponsored by IEEE Computer Society Test Technology Technical Council]
IEEE Computer Society, c2007
25th IEEE VLSI Test Symposium : proceedings : May 46-10, 2007, Berkeley, California
VTS07
VLSI Test Symposium
"IEEE Computer Society Order Number P2812"--T.p. verso
Includes bibliographical references and index