Microbeam analysis 2000 : proceedings of the Second Conference of the Internatinal Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000

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書誌事項

Microbeam analysis 2000 : proceedings of the Second Conference of the Internatinal Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000

edited by David B. Williams and Ryuichi Shimizu

(Institute of Physics conference series, no. 165)

Institute of Physics, 2000

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注記

Includes bibliographical references and indexes

内容説明・目次

内容説明

Microbeam Analysis provides a major forum for the discussion of the latest microanalysis techniques using electron, ion, and photon beams. The volume contains 250 papers from the leading researchers in this advancing field. Researchers in physics, materials science, and electrical and electronic engineering will find useful information in this volume.

目次

  • Coverage includes: Overview of microanalytical techniques
  • Interactions of electron and photons with matter
  • Monte Carlo simulation: a tool to understand practical problems
  • Analytical electron microscopy
  • Recent developments in Auger electron spectroscopy and microscopy
  • Quantification procedures in EPMA
  • Analysis of thin surface layers and multilayers by EPMA
  • Standardless quantitative analysis
  • Image processing and microscopy
  • Quantification of X-ray spectra
  • Analysis of ultra-light elements by EPMA
  • Sample preparation
  • Applications of energy dispersive spectrometry in materails science
  • Difficulties in microprobe analysis
  • Applications of electron energy loss spectroscopy
  • X-ray emission valence band spectrometry
  • Radiation damage and charging effects in SEM, EPMA and related techniques
  • Electron spectroscopy: principles and applications
  • Future applications.

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詳細情報

  • NII書誌ID(NCID)
    BA48211916
  • ISBN
    • 0750306858
  • 出版国コード
    uk
  • タイトル言語コード
    eng
  • 本文言語コード
    eng
  • 出版地
    Bristol
  • ページ数/冊数
    xxviii, 498 p.
  • 大きさ
    25 cm
  • 親書誌ID
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