C. Barry Carter, David B. Williams (eds.) ; [foreword by Sir John Meurig Thomas]

Springer c2016

: [hardback]

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David B. Williams, C. Barry Carter

Springer c2009 2nd ed

: set : pbk , 1: Basics : pbk , 2: Diffraction : pbk , 3: Imaging : pbk , 4: Spectrometry : pbk

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David B. Williams, C. Barry Carter

Springer c2009 2nd ed

: hbk

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edited by David B. Williams and Ryuichi Shimizu

Institute of Physics 2000 Institute of Physics conference series no. 165

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David B. Williams and C. Barry Carter

Springer Science+Business Media c1996

set , 1 : Basics : pbk , 2 : Diffraction : pbk , 3 : Imaging : pbk , 4 : Spectrometry : pbk

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David B. Williams and C. Barry Carter

Plenum Press 1996

: Hardbound , pbk.

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David B. Williams and C. Barry Carter

Plenum Press c1996

set , 1 : Basics : pbk , 2 : Diffraction : pbk , 3 : Imaging : pbk , 4 : Spectrometry : pbk

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edited by David B. Williams, Joseph I. Goldstein, and Dale E. Newbury

Plenum Press c1995

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edited by David B. Williams, Alan R. Pelton, Ronald Gronsky ; with a foreword by Sir Peter B. Hirsch

Oxford University Press 1991

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editors. L. D. Peachey, D. B. Williams

San Francisco Press c1990

v. 1 , v. 2 , v. 3 , v. 4

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David B. Williams

Electron Optics Pub. Co. 1987 [Rev. ed]

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editors, L.W. Hobbs, K.H. Westmacott, D.B. Williams

Materials Research Society c1986 Materials Research Society symposium proceedings v. 62

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David B. Williams

Verlag Chemie International , Electron Optics Pub. Co. c1984

: Germany , : us , : pbk

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