sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Software Engineering (TCSE), IEEE Reliability Society

IEEE Computer Society c2007

所蔵館1館

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers c2006

v. 1 : soft. , v. 2 : soft.

所蔵館1館

sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Software Engineering (TCSE), IEEE Reliability Society

IEEE Computer Society c2006

所蔵館1館

sponsored by the IEEE Electron Devices Society, the IEEE Reliability Society

IEEE Electron Devices Society : IEEE Reliability Society c2005

所蔵館1館

sponsored by IEEE Computer Society, Rliability Society

IEEE Computer Society c2005

所蔵館2館

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers c2005

: soft.

所蔵館2館

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

The Electron Devices Society and the Reliability Society of the Institute of Electrical and Electronics Engineers c2004

: softbound

所蔵館1館

sponsored by IEEE Computer Society, Reliability Society, IRISA

IEEE Computer Society c2004

所蔵館2館

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2002 c2004

: soft.

所蔵館1館

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Operations Center c2003

所蔵館1館

edited by Philip HO ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore

IEEE Operations Center c2003

所蔵館1館

sponsored by IEEE Computer Society, IEEE Reliability Society

IEEE Computer Society c2003

所蔵館2館

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers c2002 , c2003

: soft.

所蔵館2館

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Operations Center c2002

:softbound

所蔵館1館

edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technical co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore

Institute of Electrical and Electronics Engineers c2002

所蔵館1館

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2002

: soft.

所蔵館2館

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

IEEE Operations Center c2001

:softbound

所蔵館1館

sponsored by IEEE Computer Society, IEEE Reliability Society ; in cooperation with the Chinese University of Hong Kong ... [et al.]

IEEE Computer Society c2001

: case

所蔵館2館

sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society

Institute of Electrical and Electronics Engineers, c2001

: soft.

所蔵館1館

Institute of Electrical and Electronics Engineers c2001-

所蔵館49館