• IEEE Design & Test is the TTTC sponsored flagship magazine.

The Test Technology Technical Community (ex Council) is a volunteer professional organization sponsored by the IEEE Computer Society.

TTTC’s goals are to contribute to our members’ professional development and advancement, to help them solve engineering problems in electronic test, and to help advance the state-of-the art.

In particular, TTTC aims at facilitating the knowledge flow in an integrated manner, to ensure overall quality in terms of technical excellence, fairness, openness, and equal opportunities.

All TTTC activities are led by volunteer members.

For further information, please email the TTTC Chair

Upcoming conferences and symposia

IEEE VLSI Test Symposium (VTS) 2025
Paper registration: November 1, 2024
Paper PDF upload: November 8, 2024
Notification: January 31, 2025
Camera-ready upload: February 21, 2025
Conference: April 28-30, 2025

IEEE European Test Symposium (ETS) 2025

Submission deadline: December 1, 2024
Notification of acceptance: February 14, 2025
Camera-ready manuscript: March 14, 2025
Conference: May 26-30, 2025

IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS) 2025

Submission of title, abstract, and author list: February 23, 2025
Final Paper Submission: March 2, 2025
Author Notification: April 18, 2025
Camera-ready paper and author registration: May 25, 2025
Conference Dates: July 7 – 9, 2025

International Test Conference (ITC) 2025

Paper title/abstract due: March 7, 2025
Paper PDF due: March 21, 2025
Author notification: May 13, 2025
Final manuscript due: May 31, 2025
Conference Dates: September 21 – 26, 2025

AltStyle によって変換されたページ (->オリジナル) /