========== AsAP1 testing - measure one processor: - oscillator frequencies for some number of settings - max operating frequency - power dissipation - clock tree, oscillator, "ext clock" tree - inter-processor interconnect - ALU - MAC - IMEM - DMEM - power grid noise - across supply voltages - across instruction types - across different data values (random, worst case, fix one input,...) - across all processors - across task kernels and complex applications - across temperatures - estimate affect of on-chip noise by running multiple procs - measure max freq - measure voltage/waveform on one lifted power pad(?) - Goals - publish key data - learn for future chips - getting test environment stable and ready for application development, especially by outsiders and new students ========== AsAP2 testing [everything listed above for AsAP1, plus...] - leakage - find optimal VddHi/VddLow/VddAlwaysOn for different apps for optimum performance/energy/ExT
Last update: February 7, 2009