selectspm: Select Point Pattern Models Based on Minimum Contrast, AIC and
Goodness of Fit
Fit and selects point pattern models based on minimum contrast, AIC and and goodness of fit.
Version:
0.7
Published:
2025年04月29日
Author:
Marcelino de la Cruz
ORCID iD [aut, cre]
Maintainer:
Marcelino de la Cruz <marcelino.delacruz at urjc.es>
NeedsCompilation:
no
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