Visitors Number

Visitors Number

Full Range of Test Service

Engineering Service

Developing Test Capability

Currently available solution

Testing Equipment Forecast

Testing Equipment list

Testing Service

。@

Full Range of Test Service

。@ Production Testing :
。@。@。EWafer Sort (CP)
。@。@。EFinal Test
。@。@。ELead/Ball/Mark Scan
。@。@。EDry-Bake & Packing
。@。@。EEngineering Services
。@。@。EIC Characterization program develop
Back-End Turn-Key / Subcontract :
。@。@。EAssembly。ABurn In。AMarking, Dice Saw, tape & real

Engineering Service

。@

Test strategy consultant
Test program development
Test platform conversion
Test performance optimization
Multi site test upgrade
Detail effective low yield analysis

Developing Test Capability

。@

vHigh pin count up to 400 (512 available)
。EFx- Giga bit MAC : BGA388(35*35)
。EAxx - Blue Tooth : TFBGA 96(10*10 0.8mm)

High speed up to 200MHz (400Mbit available)
。E Ixxx- 133MHz
。E Sxxx- Network Processor : 200MHz
。E Pxxxx - USB2.0 : 480M bit
。E Axxx- LVDS controller : 560M bit
。E Fx- Giga bit transceiver controller : 1.25G bit

Currently Available Solution

PACKAGE 。@ Pin count 。@ 。@

QFN 4x4 24 。@ 。@ 。@

QFN 4x6 40 。@ 。@ 。@

QFN 4.5x6.5 46 。@ 。@ 。@

QFN 5x5 28 32 。@ 。@

QFN 6x6 48 。@ 。@ 。@

QFN 7x7 32 48 64 。@

QFN 8x8 56 68 。@ 。@

PACKAGE 。@ Pin count 。@ 。@

QFP 14x20 64 80 100 128

QFP 28x28 160 208 256 。@

QFP 24x24 208 。@ 。@ 。@

LQFP 20x20 144 160 176 。@

LQFP 24x24 160 176 216 。@

LQFP 14x20 100 128 。@ 。@

T/LQFP 7x7 32 48 64 。@

T/LQFP10x10 44 64 80 。@

LQFP 14x14 100 128 。@ 。@

。@ 。@ 。@ 。@ 。@

PACKAGE 。@ Pin count 。@ 。@

BGA 4.5x6.5 54 。@ 。@ 。@

BGA 7x7 81 。@ 。@ 。@

BGA 8x8 64 100 。@ 。@

BGA 9x9 100 。@ 。@ 。@

BGA 10x10 144 。@ 。@ 。@

BGA 11x11 186 。@ 。@ 。@

BGA 12x12 144 256 。@ 。@

BGA 13x13 308 。@ 。@ 。@

BGA 13x15 165 。@ 。@ 。@

BGA 14x22 119 209 。@ 。@

BGA 15x15 278 。@ 。@ 。@

BGA 15x17 165 。@ 。@ 。@

BGA 16x16 100~209 。@ 。@ 。@

BGA 17x17 256 208 。@ 。@

BGA 20x20 176 。@ 。@ 。@

BGA 23x23 300 。@ 。@ 。@

BGA 27x27 256~380 。@ 。@ 。@

BGA 35x35 388~436 。@ 。@ 。@

。@

Testing Equipment Forecast

。@

Time 2023 2024 Total

Tester Model Q2 Q3 Q4 Q1

Credence SC Series 35 。@ 。@ 。@ 35

Inovys ZFP 1 。@ 。@ 。@ 1

Credence D-10 5 。@ 。@ 。@ 5

Chroma 3600 6 。@ 。@ 。@ 6

Chroma 3360P 9 。@ 。@ 。@ 9

LTX Fusion CX 1 。@ 。@ 。@ 1

ASL1000 4 。@ 。@ 。@ 4

TR6850 5 。@ 。@ 。@ 5

S50 9 。@ 。@ 。@ 9

Total Tester 75 75 75 75 75

ESI-9350(LaserTrim) 2 。@ 。@ 。@ 2

Handler 35 2 。@ 。@ 37

Prober 22 。@ 。@ 。@ 22

Total
(Handler&Prober) 59 61 61 61 61

。@

Testing Equipment list

。@ Tester
。@。@& Credence SC Series
。@。@。@。E50/85MHz digital clock rate
。@。@。@。E256 ( Max 304 ) I/O Channels
。@。@。@。E2M/4M Vector Memory
。@。@。@。E128Mb Scan Memory
。@。@。@。EAnalog pin card
。@。@& Inovys ZFP
。@。@。@。ESpeed: 50Mhz / 100Mhz
。@。@。@。EPin Count: 512Pin.(64*8)
。@。@。@。EPattern memory: 16M
。@。@。@。EDPS 105ch,(0~3V 16A),(0~6V 2.5A),(0~16V 0.2A)
。@。@。@。EPMU 8ch,-2~5V range,+-40mA range
& Credence D-10
。@。@。@。E100MHz clock rate
。@。@。@。E200Mbps data rate (Max.)
。@。@。@。E288 / 384 digital channel (576 channel Max.)
。@。@。@。E16M pattern memory / 768M max scan depth
(1 pin/board)
。@。@。@。E16 sets DPS
。EAWG : 8 signal-ended or 4 differential
with 20bits / 300Msps
。EDIG : 4 differential with 16bits / 2.5Msps
and 14bits / 100Msps
& Chroma 3600
。@。@。@。E50/100MHz / 256Pin
。@。@。@。E16M Pattern memory
。@。@。@。EOver timer accuracy 850ps
。@。@。@。EDPS 8ch (+/- 8V, 2A)(+/- 16V, 0.8A)
。@。@。@。EPMU 4ch
。EADDA 4ch /16bit
。@。@。@。EALPG 12X, 12Y, 32D
& Chroma 3360P
。@。@。@。ETest rate 50MHz 256pin (32*8)
。@。@。@。EOver timing accuracy +/- 1.25ns
。@。@。@。E8M pattern memory (option 16M)
。@。@。@。EDPS 8ch (+/-10V, 2A)
。@。@。@。EOption UVI 16ch (+/- 10V, 500mA)
。EPMU 16ch
。@。@。@。EPPMU per pin
。@。@。@。EALPG 16X, 16Y, 16D
。EADDA 4AWG(16bit) / 4Digizer (16bit)
& LTX Fusion CX
。@。@。@。E80MHz clock rate
。@。@。@。EPatern Gen. rate 33MHz
。@。@。@。E128 digital channel (8M pattern memory)
。@。@。@。EOVI 8ch (+/- 16V, 1A)
。@。@。@。EVI16B 16ch (+16 to - 4V, 100mA)
。EAWG。G2ch with 14bits / 25Msps
。@。@。@。EDIG。G2ch with 14bits / 25Msps
。@。@。@。ERF16。G16ports (10MHz to 6GHz)
& ASL1000
。@。@。@。E14Mhz clock rate
。@。@。@。EInstrument list。G
。@。@。@ OVI。G。モ15V range
DVI。G。モ45V force range, differential
voltage measure capable
MUX。GVoltage range 200V / 500V
TMU。GTiming range of 2s to 10ns
PV3。GFully floating output
DDD。G320 KHz to 14 MHz
ACS。GSimple waveform generator
& TR6850
。@。@。@。EOVC。G8 ch, 。モ20V renge, 。モ200mA range
。@。@。@。EQVC。G4 ch, 。モ45V renge, 。モ1A range
。@。@。@。EPEB32。G32 ch, 33Mhz, 4M pattern Memory,
Level set -2~8V 。モ40mA range
。@。@。@。ETMU。G4 Set (A,B,HiZ,Trig 4ch/set),
625ps resolution, 80ch UR control bit
。@。@& S50
。@。@。@。ELOGIC *1。G
64ch (8PMU), 50Mhz, 17M Pattern memory,
-2~7V range.2DPS, 10V range, 1.73A range.
1TMU, -2~10V range, 5ns resolution.32CBIT,
5V, 60mA.
。@。@。@。EOPM *3。G
8 ch, -15~38V renge, 。モ1A range.32CBIT,
5V, 60mA.
。@。@& ESI-9350(Laser Trim)
。@。@。@。EWavelength。G1.3 」gm (IR)
。@。@。@。EMaximum Laser Pulse Equalization Rep Rate。G6 KHz
。@。@。@。EProgrammable Spot Size。G2.3 」gm ~ 6.0 」gm
。@。@。@。EMaximum setting of Energy level per pulse。G6.0 」gj
。@。@。@。ESize of Wafer。G150 mm ( 6。ィ) & 200 mm ( 8。ィ)
Handler
。@。@& NS-5000, NS-6000
。@。@。@。EPackage type。GQFP, TQFP, TSOP, SOP,
PLCC, BGA, µ BGA, CSP
。@。@。@。ETemperate。G50 to 90oC (Option。G90 to 130oC)
。@。@。@。EUp to 2 test site handling
。@。@。@。ESuperiority throughput and reliability
。@。@&Hitachi
。@。@。@。EPackage type。GQFP, TQFP, TSOP, SOP,
PLCC, BGA, µ BGA, CSP
。@。@。@。ETemperate。G50 to 90oC(Option。G90 to 130oC)
。@。@。@。EUp to 4 test site parallel testing
。ESuperiority throughput and reliability
。@。@& Multitest MT8589 / 8305L
。@。@。@。EPackage Type : TSOP , PLCC, PDIP, SOJ
。@。@。@。ETemperate : Room temp to 130oC
。@。@。@。E2 test site handling
。ESuperiority throughput and reliability
Probing Station
。@。@&TSK UF200 / UF200AL
。@。@。@。EWafer Thickness 150 to 1000」gm
。@。@。@。EWafer Size 5 , 6 , 8 Inches
。@。@。@。ETotal Accuracy : 5」gm
。@。@。@。EWafer Mapping
。@。@。@。ENetworking
。EHot temp

。@