Modern chip development is a complex process where functional verification often consumes a significant portion of project time and resources. Achieving efficient bug discovery and coverage closure is essential to prevent issues from reaching silicon. This white paper introduces an innovative approach using AI-powered Verification Space Optimization (VSO.ai) to enhance verification processes.
You will learn:
- The importance of functional verification in chip development and its impact on project timelines.
- How AI technologies can automate traditionally manual tasks to accelerate bug discovery and improve coverage closure.
- The role of coverage metrics in assessing verification progress and readiness for tapeout.
- The benefits of Change Based Verification (CBV) in focusing on areas of change to find bugs faster and improve verification confidence.
- Real-world examples of how VSO.ai has proven effective in chip development projects, reducing the number of tests while maintaining high-quality results.
Explore how Synopsys VSO.ai can transform your verification process, providing faster and more efficient coverage closure with fewer resources.