rcccd: Class Cover Catch Digraph Classification

Fit Class Cover Catch Digraph Classification models that can be used in machine learning. Pure and proper and random walk approaches are available. Methods are explained in Priebe et al. (2001) <doi:10.1016/S0167-7152(01)00129-8>, Priebe et al. (2003) <doi:10.1007/s00357-003-0003-7>, and Manukyan and Ceyhan (2016) <doi:10.48550/arXiv.1904.04564>.

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