Detailed description
- This is not a new feature.
- The existing problem is an error triggered in BMD logic for chips which are debuggable by OpenOCD using same adapteres.
- The PR solves it by ensuring DR value is predictable.
jtag_scan: Sanity check failed: BYPASS dev count doesn't match IR scan
Not tested yet. The error/warning demotion will be rebased away once I confirm the solution works.
Upd: tested to improve the situation, the chip in question became scannable by BMF. Sanity check restored.
Your checklist for this pull request
Closing issues
## Detailed description
* This is not a new feature.
* The existing problem is an error triggered in BMD logic for chips which are debuggable by OpenOCD using same adapteres.
* The PR solves it by ensuring DR value is predictable.
`jtag_scan: Sanity check failed: BYPASS dev count doesn't match IR scan`
Not tested yet. The error/warning demotion will be rebased away once I confirm the solution works.
Upd: tested to improve the situation, the chip in question became scannable by BMF. Sanity check restored.
## Your checklist for this pull request
* [x] I've read the [Code of Conduct](https://github.com/blackmagic-debug/blackmagic/blob/main/CODE_OF_CONDUCT.md)
* [x] I've read the [guidelines for contributing](https://github.com/blackmagic-debug/blackmagic/blob/main/CONTRIBUTING.md) to this repository
* [x] It builds for hardware native (see [Building the firmware](https://github.com/blackmagic-debug/blackmagic?tab=readme-ov-file#building-black-magic-debug-firmware))
* [x] It builds as BMDA (see [Building the BMDA](https://github.com/blackmagic-debug/blackmagic?tab=readme-ov-file#building-black-magic-debug-app))
* [x] I've tested it to the best of my ability
* [x] My commit messages provide a useful short description of what the commits do
## Closing issues