Text ( visual ) : unmediated
2020 IEEE International Test Conference (ITC 2020) : Washington, DC, USA, 1-6 November 2020. -- Piscataway, N.J. : IEEE , c2020. -- 573 p. : ill. ; 28 cm. -- "IEEE catalog number: CFP20ITC-POD" ; Includes bibliographical references and index. -- ISBN 9781728191140 ; (BC12311254) ; https://ci.nii.ac.jp/ncid/BC12311254
Other Title(s): CFP20ITC-POD. -- Author Heading(s): International Test Conference ; Institute of Electrical and Electronics Engineers
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