@book{ BC12311254,
 author = "International Test Conference and Institute of Electrical and Electronics Engineers",
 title = "2020 IEEE International Test Conference (ITC 2020) : Washington, DC, USA, 1-6 November 2020",
 publisher = "IEEE",
 year = "2020",
 URL = "https://ci.nii.ac.jp/ncid/BC12311254"
}
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