Text ( visual ) : unmediated
2014 IEEE International Test Conference : (ITC 2014) : Seattle, Washington, USA, 20-23 October 2014. -- Piscataway, N.J. : IEEE , c2014. -- 601 p. : ill., ports. ; 28 cm. -- "IEEE catalog Number: CFP14ITC-POD" ; Includes bibliographical references. -- ISBN 9781479947218 ; (BB18581549) ; https://ci.nii.ac.jp/ncid/BB18581549
Other Title(s): CFP14ITC-POD. -- Author Heading(s): International Test Conference ; Institute of Electrical and Electronics Engineers
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